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IEEE Design & Test


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*Average Peer Review
*Competitiveness
CiteScore
3.8

CiteScore Rank
Subject Area Rank Percentile
Category: Engineering
Subcategory: Electrical and Electronic Engineering
354 / 797
Category: Engineering
Subcategory: Hardware and Architecture
94 / 177
Category: Engineering
Subcategory: Software
230 / 407



Country/Area of Publication
UNITED STATES
Publication Frequency
Publisher
IEEE Computer Society

ISSN
2168-2356
E-ISSN
Year Publication Started
0

Self-citation (2023-2024)
0.00%
Annual Article Volume
59
Gold OA Percentage
6.08%


Open Access Info
APC APC Waiver Other Charges
N/A N/A N/A

Journal Aim & Scope
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.


Web of Science Quartiles
WOS Quartile: Q3

Quartiles By JIFCollectionQuartileRankPercentage
Category: COMPUTER SCIENCE, HARDWARE & ARCHITECTURESCIEQ342/59
Category: ENGINEERING, ELECTRICAL & ELECTRONICSCIEQ3211/352
Quartiles By JCICollectionQuartileRankPercentage
Category: COMPUTER SCIENCE, HARDWARE & ARCHITECTURESCIEQ340/59
Category: ENGINEERING, ELECTRICAL & ELECTRONICSCIEQ3217/354
*Crowdsourced data
  • Journals In The Same Subject Area
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  • IEEE Design & Test IEEE Design & Test
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